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Prague

Prague

Prague

Prague
Symposium programme

AUGUST 25, 2008 - Monday
09:00 - 09:10 Opening
Miroslav Jedlièka
09:10 - 10:50 Interferometry & Optical Testing Techniques
09:10 - 09:30 Investigation on Performance Verification of Coordinate Measuring Systems with Optical Distance Sensors
Simone Carmignato, Enrico Savio
09:30 - 09:50 Measurement of the Refractive Index Profile of Polymer Planar Optical Waveguides using Optical Coherence Tomography
David Ives
09:50 - 10:10 Interferometer Based Methods for Research of Piezoelectric Materials
Miroslav Sulc
10:10 - 10:30 Dynamic Digital Holography Based on Temporal Domain Hilbert Transform Phase Analysis
Violeta Dimitrova Madjarova, Motofumi Kataoka, Hirofumi Kadono
10:30 - 10:50 Coffee Break
10:50 - 11:50 Image Processing and Simulation
10:50 - 11:10 Collisions Avoidance in Machine Tools Using a Scalable Image Processing system
Robert Schmitt, Bjoern Dietrich
11:10 - 11:30 Edge Extraction in Polarized Images
Andrzej Walzcak, Leszek Puzio, Edward Nowinowski-Kruszelnicki, Marek Sutkowski, Piotr Garbat
11:30 - 11:50 Restoration of the Scalar Field on the Base of the Analysis of Intensity Stationary Points Network
Yu. Galushko, I.Mokhun
11:50 - 12:15 TC 2 Member Meeting
12:15 - 14:00 Lunch Break
14:00 - 15:40 Spectroscopy and Scattering Techniques
14:00 - 14:20 Use and Errors in Diode Array Spectrometry
J. Schanda
14:20 - 14:40 Advanced Optical Characterization of RCE Optoelectronic Devices
J. Kovac jr., V. Gottschalch, J. Kovac, B. Rheilnänder, J. Skriniarova, J. Jakabovic, D. Hasko, J. Chovan
14:40 - 15:00 Measurement of Diffused Light Due to Multiple Scattering in Body Cells
Pavel Tománek, Lubomír Grmela, Pavel Dobis, Jitka Brüstlová
15:00 - 15:20 Spectrofluorimetric AOTF-based Test-bench for Imaging and Time-resolved Measurements
Vitold Pozhar, Vladimir Shorin, Alexey Perchik, Sergey Boritko, Igor Kutuza, Igor Shilov
15:20 - 15:40 Fine Spectroscopy of Heterolaser Radiation Change under an Ultrasound Strain
L.A. Kulakova
15:40 - 16:00 Coffee Break
16:00 - 17:30 Poster Session
Phase Measurement of Optical Wavefront by Using an SLM Knife-edge Filter
Hideo Furuhashi, Javier Valle Mayorga, Yoshiyuki Uchida, Akihiro Kono
EUROMET #610: Comparison of Reference Laser Interferometer Systems
Petr Balling, Petr Køen
Dynamic Null Screens for Testing Fast Aspheric Convex Surfaces with LCD´s
V.I. Moreno-Oliva, M. Campos-García, M. Avenda?o-Alejo, R. Díaz-Uribe
Null Hartmann Screen for Measuring the Spherical Aberration in a Plane-convex Lens
M. Avendaño-Alejo, D. M. González-Utrera, V. I. Moreno-Oliva, R. Díaz-Uribe
Optical Testing of a Hyperbolic Concave Surface by a Cylindrical Null Screen
M. Campos-García, V.I. Moreno-Oliva, M. Avenda?o-Alejo, and R. Díaz-Uribe
Analyses of the Temperature Dependence of PMD with Temperature in Optical Fibers
Giovanna Borghi, A. Bessa dos Santos, J. P. von der Weid
Machine Vision-based automated Tool Wear Inspection System
Robert Schmitt, Philip Hafner, Bjoern Damm
Metrological Performance of SEM 3D Techniques
Francesco Marinello, Simone Carmignato, Enrico Savio, Paolo Bariani, Andy Horsewell, Leonardo De Chiffre
All Fibre Continuous Wave Supercontinuun Sources for Fibre Sensing Proposes
Sonia Martín-López, Pedro Corredera, Laura Abrardi, Ana Carrasco-Sanz, Felix Rodriguez-Barrios, M.Luisa Hernanz, Miguel González-Herráez
Portable Mid Infrared Optical Sensor for Measuring of Water Concentration in Oil
N. D. Stoyanov, M.P. Mikhailova, S.S. Molchanov, K.V. Kalinina, A.P. Astakhova, T.I. Gurina, H.M. Salikhov, Yu.P. Yakovlev
LED Illuminating System Using Photonic Crystal Fiber Light Pipe
Shen Chang-yu, Jin Shang-Zhong
Principles and Application Research of Distributed Optical Fiber Sensor System
Jianfeng Wang , Zaixuan Zhang , Xiangdong Yu , Honglin Liu
Compact LED-based Device for Luminescence Measurements of Porphyrin Metal-complexes
Igor Shilov, Kamil Shamkhalov, Boris Zubov, Anatoly Pashinin, Georgy Danielian, Vitold Pozhar
19:00 Meeting Point for Welcome Reception on Poseidon Boat
Poseidon Boat



AUGUST 26, 2008 - Tuesday
09:00 - 09:40 Optoelectronic Sensor-Technologies and Light Sources
09:00 - 09:20 Scanning Raster Method as Perspective Technology of Precision Angle Measuring Structure Production
Valery P. Kiryanov, Alexey V. Kiryanov, Ilya F. Klistorin
09:20 - 09:40 Si Broadband (3-12 um) Emitting Diodes Operating at T ? 300K
Volodymyr Malyutenko, Oleg Malyutenko, Andriy Tykhonov, Remigiusz Grodecki, Tadeusz Piotrowski, Jerzy Pultorak, Maciej Wegrzecki
09:40 - 10:00 Applications for optical 1D and 2D sensors
09:40 - 10:00 On-line Measurement of Refractive Index Variations in Optical Foils
Dominik Hofer, Bernhard Zagar
10:00 - 10:20 Fiber Optical Sensors
10:00 - 10:20 Acoustic Detection of Partial Discharges with an Optical Fiber Interferometric Sensor
Carlos Macia-Sanahuja, Horacio Lamela, Jesús Rubio, Daniel Gallego, Julio Posada, Jose A. Garcia-Souto
10:20 - 10:40 Coffee Break
10:40 - 12:40 Development of Optical Measurement Systems I.
10:40 - 11:00 Development of a Fully Automated Fibre Interferometer
G. Lakshminarayanan, Shanti Bhattacharya, C. A. Khansa and A. Prabhakar
11:00 - 11:20 Absolute Frequency Shifts of Iodine-Stabilized Laser Etalons in Relation to Iodine Purity in Absorption Cells
Jan Hrabina, Petr Jedlicka, Ondøej Cip, Josef Lazar
11:20 - 11:40 Measurement of Sheet-metal Planar Anisotropy at Medium Strain-rates by Digital Image Correlation
R. Tutsch, M. Fischer, G.B. Broggiato, V. Veglianti, D. Ferrari
11:40 - 12:00 Development of an Innovative Laser Scanner for Geometrical Verification of Metallic and Plastic Parts
Simone Carmignato, L. De Chiffre, R. Fisker, K. Hollenbeck, Enrico Savio
12:00 - 12:20 Experimental Set-up for Characterisation of Devices for Integrated Photonics
Jozef Chovan, Frantisek Uherek
12:20 - 12:40 Cryogenic Radiometer: Performance and Characteriziation as a Primary Standard at Inmetro
M. S. Lima, A. P. Cunha Legal, H. P. Grieneisen and I. B. Couceiro
12:40 - 14:00 Lunch Break
14:00 - 15:00 Development of Optical Measurement Systems II.
14:00 - 14:20 Non-contact Optical Measurement Systems for Inspection and Monitoring of Geometrical Parameters in Industrial Applications
Yuri V. Chugui, Alexander G. Verkhogliad, Vladimir S. Bazin, Stepan V. Kalichkin, Vadim E. Kalikin, Sergei N. Makarov, Sergei G. Savkov
14:20 - 14:40 Optical Measuring System Used In Magnetic Field Detectors
Jacek Golebiowski
14:40 - 15:00 A High-sensitivity Heterodyne Interferometer for Industrial Metrology
Thilo Schuldt, Martin Gohlke, Dennis Weise, Achim Peters, Ulrich Johann, Claus Braxmaier
15:00 - 15:10 Closing